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The effect of low-temperature annealing upon the structure and electrical characteristics of rectifying nickel-silicon contacts : O.P. Kancukovskij, S.B. Kazimirskij, L.V. Moroz and V.A. Presnov. Electron Technol., Warsaw10, (2) 37 (1977)


Publisher
Elsevier Science
Year
1978
Tongue
English
Weight
131 KB
Volume
17
Category
Article
ISSN
0026-2714

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