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The Effect of Line Traps in the Calculation of Short Line Fault Transient Recovery Voltages

✍ Scribed by Jones, Robert A.

Book ID: 117900007
Publisher: IEEE
Year: 1985
Tongue: English
Weight: 158 KB
Volume: PER-5
Category: Article
ISSN: 0272-1724
DOI: 10.1109/mper.1985.5528645

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