The effect of ionic contaminants on silicon transistor stability : A. A. Bergh and G. H. Schneer, IEEE Trans. Reliab. R-18, No. 2, May (1969), p. 34

• Book ID: 103269120
• Publisher: Elsevier Science
• Year: 1970
• Tongue: English
• Weight: 101 KB
• Volume: 9
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(70)90454-3