The effect of interface states, at mid-gap, in p-silicon/SiO2 junctions: K. M. Brunson, D. Sands, M. H. Tayarani-Najaran and C. B. Thomas. Vacuum 38, 377 (1988)

• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 129 KB
• Volume: 29
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(89)90291-6