The effect of interface roughness on the transport properties of a two-dimensional electron gas in a Si-MOSFET

✍ Scribed by Zianni, X; Butcher, P N

• Book ID: 120588515
• Publisher: Institute of Physics
• Year: 1994
• Tongue: English
• Weight: 582 KB
• Volume: 6
• Category: Article
• ISSN: 0953-8984
• DOI: 10.1088/0953-8984/6/14/009