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The effect of impurity concentration dependent static dielectric constant on band-gap narrowing in heavily doped silicon

✍ Scribed by Ristić, S. D. ;Prijić, Z. D. ;Mijalković, S. Ž.


Publisher
John Wiley and Sons
Year
1995
Tongue
English
Weight
443 KB
Volume
148
Category
Article
ISSN
0031-8965

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