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The effect of grain boundary scattering on the electrical resistivity of polycrystalline lead, tin, and tin–lead alloy films

✍ Scribed by Kumar, A. ;Chandra, G. ;Katyal, O. P.


Publisher
John Wiley and Sons
Year
1987
Tongue
English
Weight
385 KB
Volume
100
Category
Article
ISSN
0031-8965

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