𝔖 Bobbio Scriptorium

✦ LIBER ✦

The effect of geometry on the characteristics of thick film resistors : D. E. Riemer, Proc. 20th Electron. Compon. Conf., IEEE, 13–15 May (1970), p. 102

Publisher: Elsevier Science
Year: 1971
Tongue: English
Weight: 108 KB
Volume: 10
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(71)90755-4

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