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The effect of gate leakage on the noise figure of AlGaN/GaN HEMTs

✍ Scribed by Sanabria, C.; Chakraborty, A.; Hongtao Xu; Rodwell, M.J.; Mishra, U.K.; York, R.A.

Book ID: 115526386
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 150 KB
Volume: 27
Category: Article
ISSN: 0741-3106
DOI: 10.1109/led.2005.860889

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