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The effect of fan-reliability and cooling-performance on electronic-chassis reliability : John M. Hogan. IEEE Transactions on Reliability, 42(1), 172 (1993)

Book ID: 103287475
Publisher: Elsevier Science
Year: 1994
Tongue: English
Weight: 111 KB
Volume: 34
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(94)90231-3

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