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The effect of endless burn-in on reliability growth projections: A. G. Bezat and L. L. Montague. Proc. IEEE Reliability Symposium, Washington D.C., January 23–25, p. 392 (1979)

Publisher: Elsevier Science
Year: 1980
Tongue: English
Weight: 250 KB
Volume: 20
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(80)90429-1

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📂 Article 📅 1980 🏛 Elsevier Science 🌐 English ⚖ 126 KB