✦ LIBER ✦
The effect of condensation heat of gate electrode metal upon stability and dielectric strength of MOS structures : J. Mitros and E. Tworek. Electron Technol. 6, 75 (1973)
- Publisher
- Elsevier Science
- Year
- 1974
- Tongue
- English
- Weight
- 111 KB
- Volume
- 13
- Category
- Article
- ISSN
- 0026-2714
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