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The distribution of Ga and Sb impurities in Ge-Si crystals grown by the Bridgman method using a feeding rod

โœ Scribed by G. Kh. Azhdarov; Z. M. Zeynalov; L. A. Huseynli


Book ID
111438095
Publisher
SP MAIK Nauka/Interperiodica
Year
2009
Tongue
English
Weight
196 KB
Volume
54
Category
Article
ISSN
1063-7745

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