✦ LIBER ✦
The Development of a High Rate Tensile Testing System for Micro Scaled Single Crystal Silicon Specimens
✍ Scribed by Dubelman, S.; Raghunathan, N.; Peroulis, D.; Chen, W.
- Book ID
- 121533600
- Publisher
- Sage Publications
- Year
- 2013
- Tongue
- English
- Weight
- 373 KB
- Volume
- 54
- Category
- Article
- ISSN
- 0014-4851
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