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The determination of the average compositions of amorphous interlayers in the VSi system using a buried ultrathin oxide layer and a capping Mo layer to define the reference planes for interdiffusion

✍ Scribed by J.H. Lin; L.J. Chen


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
314 KB
Volume
92
Category
Article
ISSN
0169-4332

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