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The Determination of Surface Potential Fluctuation Values and Spatial Distribution of Traps in Insulators from the Temperature Dependence of the (Gp/ω)–ω Curves of MOS Structures

✍ Scribed by Frantsuzov, A. A. ;Kovchavtsev, A. P.


Publisher
John Wiley and Sons
Year
1983
Tongue
English
Weight
535 KB
Volume
79
Category
Article
ISSN
0031-8965

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