The detection of rare earth impurities in ionic materials by X-ray-stimulated luminescence
β Scribed by W. A. Shand
- Publisher
- Springer
- Year
- 1968
- Tongue
- English
- Weight
- 362 KB
- Volume
- 3
- Category
- Article
- ISSN
- 0022-2461
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π SIMILAR VOLUMES
The use of a basic total reflection x-ray fluorescence (TXRF) unit coupled to a fine structure MO x-ray tube for the determination of rare earth elements (REEs) in geological materials was investigated. Three certified reference rock materials, viz. shale Awl-l, psammite PRI-1 and schist SBO-1, were
X-ray photoelectron spectroscopy (XPS) and X-ray absorption near-edge spectroscopy (XANES) have been applied to examine the electronic structure of the rare-earth transition-metal oxyarsenides REFeAsO (RE ΒΌ Ce, Pr, Nd, Sm, Gd) and CeNiAsO. Within the metal-arsenic layer [MAs], the bonding character