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The depth profile of high-dose low-mass ions implanted into higher mass substrate by RBS analysis

✍ Scribed by Yin Shi-duan; Zhang Jing-ping; Gu Quan; Liu Shi-jie; Xie Bao-zhan; Ma Tie-liang; Qu Zhen-yuan


Publisher
Elsevier Science
Year
1981
Weight
196 KB
Volume
191
Category
Article
ISSN
0167-5087

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