๐”– Bobbio Scriptorium
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The dependence of track response on registration temperature in Lexan and CR-39

โœ Scribed by A. Thompson; D. O'Sullivan; J.H. Adams Jr.; L.P. Beahm


Publisher
Elsevier Science
Year
1981
Weight
45 KB
Volume
5
Category
Article
ISSN
0191-278X

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๐Ÿ“œ SIMILAR VOLUMES


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The present work describes the experimental measurement of the total etchable range for different heavy ions, ':C (8.7 MeV/N), ':O (8.7 MeV/N). :gNe (7.7 MeV/N), $i (6.4 MeV/N), $Fe (6.4 MeV/N) and i:Ni (6.5 MeViN) in CR-39 (Dop) and Lexan polycarbonate plastic track detectors. The energy loss rate

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The amount of pre-etchlng needed to register electrochemlcally-etched (ECE) tracks efficiently in CR-39 varies with the particle LET. This dependence was studied for monoenergetlc alpha particles from i to 5.5 MeV and protons from 0.4 to 13.8 MeV. Pre-etchlng must be between upper and lower limits,