𝔖 Bobbio Scriptorium
✦   LIBER   ✦

The dependence of the electronic ground-state of n-type silicon inversion layers on stress, temperature, magnetic field and gate voltage

✍ Scribed by M.J. Kelly; L.M. Falicov


Book ID
118982482
Publisher
Elsevier Science
Year
1978
Tongue
English
Weight
959 KB
Volume
73
Category
Article
ISSN
0039-6028

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES