The defect density of a SiNx/In0.53Ga0.47As interface passivated using (NH4)2Sx

✍ Scribed by H.J. Tang; X.L. Wu; K.F. Zhang; Y.F. Li; J.H. Ning; Y. Wang; X. Li; H.M. Gong

• Book ID: 106021038
• Publisher: Springer
• Year: 2008
• Tongue: English
• Weight: 530 KB
• Volume: 91
• Category: Article
• ISSN: 1432-0630
• DOI: 10.1007/s00339-008-4500-8