𝔖 Bobbio Scriptorium
✦   LIBER   ✦

The d−3 Law Describing the Thickness Dependence of the Electrical Resistivity of Rough Metal Films

✍ Scribed by H.-U. Finzel; Prof. Dr. P. Wissmann


Publisher
John Wiley and Sons
Year
1986
Tongue
English
Weight
356 KB
Volume
498
Category
Article
ISSN
0003-3804

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES


Influence of Mn as a redox-active centra
✍ D. Schlettwein; J.-P. Meyer; N. I. Jaeger 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 79 KB 👁 2 views

Thin films of phthalocyaninatomanganese ( PcMn ) in the thickness range of 100 nm have been prepared by vapour deposition on quartz glass substrates. The films were characterized in situ during film growth and following film deposition by measurements of the electrical conductivity under DC applied

The molecular structure of poly(biphenyl
✍ Geoffrey D. Hietpas; David L. Allara 📂 Article 📅 1998 🏛 John Wiley and Sons 🌐 English ⚖ 295 KB

The molecular structure of poly[biphenyl dianhydride-p-phenylenediamine] (BPDA-PDA) polyimide in ultrathin (3-300 nm) films on silicon has been characterized by polarized infrared spectroscopy in conjunction with ellipsometry and X-ray reflectivity measurements. In spite of the high degree of crysta