The Critical Current of REBCO Coated Conductors and Experimental Observation of Delamination Due to the Screening Current at 4.2 K

✍ Scribed by Miyazoe, A.; Zhiyu Zhang, ; Matsumoto, S.; Kiyoshi, T.

• Book ID: 121649177
• Publisher: IEEE
• Year: 2013
• Tongue: English
• Weight: 938 KB
• Volume: 23
• Category: Article
• ISSN: 1051-8223
• DOI: 10.1109/TASC.2013.2243192