✦ LIBER ✦

The correlation of EPQ psychoticism with two behavioural measures of impulsivity

✍ Scribed by Rawlings, David

Book ID: 123212868
Publisher: Elsevier Science
Year: 1984
Tongue: English
Weight: 422 KB
Volume: 5
Category: Article
ISSN: 0191-8869
DOI: 10.1016/0191-8869(84)90034-5

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

The role of behavioural measures of impu

The role of behavioural measures of impulsivity in the development of alcohol dependence

✍ Rubio, G.; Jiménez-Giménez, M.; Martinez-Grass, I.; Rodriguez, R.; Ponce, G.; Fe 📂 Article 📅 2008 🏛 Elsevier Science 🌐 French ⚖ 66 KB

Impulsivity: A state as well as trait va

Impulsivity: A state as well as trait variable. Does mood awareness explain low correlations between trait and behavioural measures of impulsivity?

✍ Janet Wingrove; Alyson J. Bond 📂 Article 📅 1997 🏛 Elsevier Science 🌐 English ⚖ 786 KB

Behavioural and physiological correlates

Behavioural and physiological correlates of impulsivity in the domestic dog (Canis familiaris)

✍ Hannah F. Wright; Daniel S. Mills; Petra M.J. Pollux 📂 Article 📅 2012 🏛 Elsevier Science 🌐 English ⚖ 327 KB

Stability of differential systems with i

Stability of differential systems with impulsive perturbations in terms of two measures

✍ S. Leela 📂 Article 📅 1977 🏛 Elsevier Science 🌐 English ⚖ 631 KB

The asymptotic behaviours of an epidemic

The asymptotic behaviours of an epidemic model with two correlated stochastic perturbations

✍ Guixin Hu; Meng Liu; Ke Wang 📂 Article 📅 2012 🏛 Elsevier Science 🌐 English ⚖ 957 KB

Measurements of carrier diffusion length

Measurements of carrier diffusion length in processed wafers: correlation with the electrical behaviour

✍ M.L. Polignano; L. Maitre; G. Queirolo 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 621 KB

A comparison between diffusion length measurements and electrical data is presented. Electrically defective junctions have been analyzed in detail. After complete electrical characterization, diffusion length maps of typical and defective wafers have been obtained from Elymat measurements. Some elab