The correlation between electroluminescence properties and the microstructure of Europium-implanted MOS light emitting diodes

✍ Scribed by L. Rebohle; J. Lehmann; A. Kanjilal; S. Prucnal; A. Nazarov; I. Tyagulskii; W. Skorupa; M. Helm

• Publisher: Elsevier Science
• Year: 2009
• Tongue: English
• Weight: 369 KB
• Volume: 267
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2009.01.121