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The convergent effect of the annealing temperatures of electron irradiated defects in FZ silicon grown in hydrogen : Qin Guogang and Hua Zonglu. Solid St. Commun. 53 (11) 975 (1985)


Publisher
Elsevier Science
Year
1986
Tongue
English
Weight
128 KB
Volume
26
Category
Article
ISSN
0026-2714

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