The computation of yield and drift reliability of electronic circuits : F. Jenson. Microelectron. & Reliab. 11 (1972), p. 139

• Publisher: Elsevier Science
• Year: 1973
• Tongue: English
• Weight: 114 KB
• Volume: 12
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(73)90620-3