The comparative XPS and PYS studies of SnO2 thin films prepared by L-CVD technique and exposed to oxygen and hydrogen

✍ Scribed by J Szuber; G Czempik; R Larciprete; B Adamowicz

• Book ID: 108469253
• Publisher: Elsevier Science
• Year: 2000
• Tongue: English
• Weight: 146 KB
• Volume: 70
• Category: Article
• ISSN: 0925-4005
• DOI: 10.1016/s0925-4005(00)00564-5