The common thread for operational reliability and failure physics : Kam L. Wong. Microelectron. Reliab.22 (2), 177 (1982)

• Book ID: 103278379
• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 95 KB
• Volume: 23
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(83)91025-9