✦ LIBER ✦
The classification and quality control of thin-films by the recognition of X-ray diffraction lines : S. Kawarai, R. Koike, M. Shintani and N. Furuya. Trans. Inst. Electron. & Commun. Engrs Japan56, No. 1, January (1973), p. 23
- Publisher
- Elsevier Science
- Year
- 1973
- Tongue
- English
- Weight
- 109 KB
- Volume
- 12
- Category
- Article
- ISSN
- 0026-2714
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