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The characterization of Ti and Al oxide overlayers on rhodium and gold by XPS

✍ Scribed by M.E. Levin; M. Salmeron; A.T. Bell; G.A. Somorjai


Book ID
118362230
Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
772 KB
Volume
195
Category
Article
ISSN
0039-6028

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Mechanism of the oxygen-stimulated deact
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## Mechanism of the Oxygen-stimulated Deactivation of RuyTil-y-Oxide Overlayers on Ti Studied by XPS, SEM and Electro chemical Te ehniques By means of wet oxygen exposure the stability o f RTO anodes has been observed. The deactivation is due to ruthenium loss via unstablc liiglier surface oxides