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The Characteristics of Seebeck Coefficient in Silicon Nanowires Manufactured by CMOS Compatible Process

✍ Scribed by Moongyu Jang; Youngsam Park; Myungsim Jun; Younghoon Hyun; Sung-Jin Choi; Taehyoung Zyung

Book ID
107470811
Publisher
Springer-Verlag
Year
2010
Tongue
English
Weight
347 KB
Volume
5
Category
Article
ISSN
1931-7573

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