✦ LIBER ✦
The characterisation of GaAs NiAuGe ohmic contacts alloyed with an SiO2 overlayer for use in an ion implanted MESFET technology
✍ Scribed by David A Allan; Stuart C Thorp
- Publisher
- Elsevier Science
- Year
- 1985
- Weight
- 361 KB
- Volume
- 129
- Category
- Article
- ISSN
- 0378-4363
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