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The challenges for electrical engineers in non-destructive testing: London, UK, 25 January 1984

✍ Scribed by S.M. Hitchcock

Publisher: Elsevier Science
Year: 1984
Weight: 259 KB
Volume: 17
Category: Article
ISSN: 0308-9126
DOI: 10.1016/0308-9126(84)90013-0

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