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The cell method, a new approach to multiple stuck-at-fault test generation : Carl D. Latino and Jon G. Bredeson. Int. J. Electron.46, (5) 465 (1979)


Book ID
103276100
Publisher
Elsevier Science
Year
1980
Tongue
English
Weight
131 KB
Volume
20
Category
Article
ISSN
0026-2714

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