The Capacitance and Characteristic Relaxation Times at Carrier Exclusion in Compensated Semiconductors with Deep Traps and Non-Injecting Contacts

✍ Scribed by Aronov, D. A. ;Mamatkulov, B. R.

• Publisher: John Wiley and Sons
• Year: 1984
• Tongue: English
• Weight: 246 KB
• Volume: 81
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2210810166