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The Capacitance and Characteristic Relaxation Times at Carrier Exclusion in Compensated Semiconductors with Deep Traps and Non-Injecting Contacts

โœ Scribed by Aronov, D. A. ;Mamatkulov, B. R.


Publisher
John Wiley and Sons
Year
1984
Tongue
English
Weight
246 KB
Volume
81
Category
Article
ISSN
0031-8965

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