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The atomic force microscope used as a powerful tool for machining surfaces

✍ Scribed by T.A. Jung; A. Moser; H.J. Hug; D. Brodbeck; R. Hofer; H.R. Hidber; U.D. Schwarz


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
914 KB
Volume
42-44
Category
Article
ISSN
0304-3991

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## Abstract By controlling the interaction between the atomic force microscope tip and mica, patterns of different sizes and shape have been produced on the surface of mica. Using these operator‐constructed patterns as a reliable marker, the original scanned sample location can be re‐located and im