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The approximate concurrence of metrological and operational bases when measuring deviations in the shape of surface by straightedge

✍ Scribed by V. G. Pustovalov

Publisher: Springer US
Year: 1981
Tongue: English
Weight: 256 KB
Volume: 24
Category: Article
ISSN: 0543-1972
DOI: 10.1007/bf00829944

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