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The application of transmission line pulse testing for the ESD analysis of integrated circuits

โœ Scribed by T Smedes; R.M.D.A Velghe; R.S Ruth; A.J Huitsing


Book ID
108431938
Publisher
Elsevier Science
Year
2002
Tongue
French
Weight
593 KB
Volume
56
Category
Article
ISSN
0304-3886

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Computer-aided quasi-static analysis of
โœ Beker, Benjamin ;Cokkinides, George J. ๐Ÿ“‚ Article ๐Ÿ“… 1994 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 683 KB

## Abstract The finite difference method (FDM) is applied to the analysis of microwave integrated circuit (MIC) components that are based on the coplanar waveguide geometry. Effective dielectric constant, attenuation due to dielectric loss, and line impedance are calculated for open and shielded MI