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The application of statistical methodology to the analysis of time-resolved X-ray diffraction data

✍ Scribed by Burley, Jonathan C.; O'Hare, Dermot; Williams, Gareth R.

Book ID: 118052342
Publisher: The Royal Society of Chemistry
Year: 2011
Tongue: English
Weight: 420 KB
Volume: 3
Category: Article
ISSN: 1759-9660
DOI: 10.1039/c0ay00772b

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