✦ LIBER ✦
The application of marginal voltage measurements to detect and locate defects in digital microcircuits : D. J. Ager, G. F. Cornwell and I. W. Stanley. Microelectron. Reliab.22 (2), 241 (1982)
- Book ID
- 103278388
- Publisher
- Elsevier Science
- Year
- 1983
- Tongue
- English
- Weight
- 124 KB
- Volume
- 23
- Category
- Article
- ISSN
- 0026-2714
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