✦ LIBER ✦

The application of focused ion beam microscopy in the material sciences

✍ Scribed by P.R. Munroe

Book ID: 113780277
Publisher: Elsevier Science
Year: 2009
Tongue: English
Weight: 708 KB
Volume: 60
Category: Article
ISSN: 1044-5803
DOI: 10.1016/j.matchar.2008.11.014

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