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The application of computer aids in the analysis of fault data generated by a large data handling system : M. J. Reynolds and T. V. Attwood, IEE Conf. Reliab. Electron., Conf. Publ. No. 60, 10–12 December (1969), p. 45


Publisher
Elsevier Science
Year
1970
Tongue
English
Weight
115 KB
Volume
9
Category
Article
ISSN
0026-2714

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