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The application of complex Pade approximants to reflection at optical waveguide facets

✍ Scribed by El-Refaei, H.; Betty, I.; Yevick, D.

Book ID
111694784
Publisher
IEEE
Year
2000
Tongue
English
Weight
120 KB
Volume
12
Category
Article
ISSN
1041-1135

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## Abstract A new measurement technique is presented to determine the complex permittivity of a dielectric material. The dielectric sample is loaded in a short‐circuited rectangular waveguide. The reflection coefficient of the waveguide is measured by Network analyzer and calculated as a function o