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The application of a VUV-FT spectrometer and synchrotron radiation source to measurements of the NO and O2 bands at 295 K

✍ Scribed by K Yoshino; A.R Thorne; J.E Murray; K Ito; T Matsui; K.W.-S Leung; A.S.-C Cheung; T Imajo

Book ID: 117779292
Publisher: Elsevier Science
Year: 2000
Tongue: English
Weight: 385 KB
Volume: 25
Category: Article
ISSN: 1464-1917
DOI: 10.1016/s1464-1917(00)00006-4

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