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The applicability of acoustic emission as a non-destructive test for hybrid microelectronic circuits: J. Savage, R. T. W. Morrison and R. E. Cooper. Proc. Internepcon UK '79 p. 192, Brighton (16–18 October 1979)


Publisher
Elsevier Science
Year
1980
Tongue
English
Weight
118 KB
Volume
20
Category
Article
ISSN
0026-2714

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