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The anisotropy of the thermal expansion in the AgInC2VI chalcopyrite-type compounds from the X-ray diffraction data

โœ Scribed by Orlova, N. S. ;Bodnar, I. V.


Publisher
John Wiley and Sons
Year
1987
Tongue
English
Weight
275 KB
Volume
101
Category
Article
ISSN
0031-8965

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X-ray study of the thermal expansion ani
โœ P. Kistaiah; C. Vishnu Vardhan Reddy; K. Satyanarayana Murthy ๐Ÿ“‚ Article ๐Ÿ“… 1988 ๐Ÿ› Elsevier Science โš– 555 KB

Accurate lattice parameters a and c of the tetragonal chalcopyrite quaternary semiconductor CuGaSnl3Se4 have been determined as a function of temperature by the X-ray powder diffraction method in the temperature range 300 K to about 900 K. The data have been used to evaluate the axial expansion coef