The analysis on the origin of high resistivity in Cl-doped polycrystalline CdZnTe thick films

✍ Scribed by K. H. Kim; Y. J. Park; Y. H. Na; J. K. Hong; T. R. Jung; Y. Yi; S. U. Kim

• Publisher: John Wiley and Sons
• Year: 2004
• Tongue: English
• Weight: 341 KB
• Volume: 1
• Category: Article
• ISSN: 1862-6351
• DOI: 10.1002/pssc.200304289