The analysis of the charge transport mechanism of n-Si/MEH-PPV device structure using forward bias I–V–T characteristics

✍ Scribed by A. Sertap Kavasoglu; Fahrettin Yakuphanoglu; Nese Kavasoglu; Osman Pakma; Ozcan Birgi; Sener Oktik

• Book ID: 116605997
• Publisher: Elsevier Science
• Year: 2010
• Tongue: English
• Weight: 862 KB
• Volume: 492
• Category: Article
• ISSN: 0925-8388
• DOI: 10.1016/j.jallcom.2009.11.128