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The analysis of superconducting thin films modified by AFM lithography with a spectroscopic imaging technique

✍ Scribed by Hyeong-Gon Kang; Seong Kyu Kim; Haeseong Lee


Book ID
108279327
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
327 KB
Volume
600
Category
Article
ISSN
0039-6028

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